XRF Testing
An electron can range from the atomic orbital by the absorption of light waves (photons of sufficient energy) to be ejected. The energy of the photon (HV) must be greater than the energy that the electron is bound to the nucleus of the atom. An inner orbital electrons from an atom ejects an electron from a higher orbital energy is transferred to the lower orbital energy level will be transferred. During this transition, a photon can come from the atom. The fluorescent light is the characteristic X-rays of the element. The energy of the emitted photon is equal to the difference in energy between the two orbitals occupied by the electron during the transition. Since the energy difference between two specific orbital shells, in a certain element is always the same (ie characteristic) for a particular component, the photon is emitted when an electron moves between these two levels, will always have the same energy. Therefore, by determining the energy (wavelength) of the X-ray light (photons) are emitted by a particular element, it is possible, the identity of the element.
For a certain energy (wavelength) of fluorescent light, which is an element, the number of photons emitted per unit of time (commonly referred to as peak intensity or count rate) on the amount of analyte in the sample. The count rates for all visible elements in a sample are usually measured by counting, for a certain period, the number of photons that are detected for the different analytes characteristic X-ray energy lines. It is important to note that these contributions are as fluorescent peak observed with a half-Gaussian distribution due to the inadequate resolution of the art detector technology. Therefore, by determining the energy of the X-ray spectrum peaks in a sample, and by calculating the rate of the different number of elementary peaks, it is possible to qualitatively determine the elemental composition of samples and quantitative measurement of the concentration of these elements.
XRF Testing
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